self-supervised learning
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Adaptive Compute for Test-Time Training with PonderTTT
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PonderTTT introduces an adaptive compute strategy for Test-Time Training (TTT) in language models, where the computational effort is adjusted based on task complexity. By using the TTT layer's self-supervised reconstruction loss, the model decides whether to update its weights—high loss indicates difficulty and prompts an update, while low loss suggests confidence and skips the update. This method, tested on GPT-2 models ranging from 124M to 1.5B parameters, requires no additional training beyond setting a threshold and using Exponential Moving Average (EMA). Although current testing focuses on perplexity, future work aims to expand to generation benchmarks, with ongoing efforts to scale up experiments using TPU. This approach matters as it aims to optimize computational resources, making language models more efficient and potentially more effective at handling diverse tasks.
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Optimizing Semiconductor Defect Classification with AI
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Semiconductor manufacturing faces challenges in defect detection as devices become more complex, with traditional convolutional neural networks (CNNs) struggling due to high data requirements and limited adaptability. Generative AI, specifically NVIDIA's vision language models (VLMs) and vision foundation models (VFMs), offers a modern solution by leveraging advanced image understanding and self-supervised learning. These models reduce the need for extensive labeled datasets and frequent retraining, while enhancing accuracy and efficiency in defect classification. By integrating these AI-driven approaches, semiconductor fabs can improve yield, streamline processes, and reduce manual inspection efforts, paving the way for smarter and more productive manufacturing environments. This matters because it represents a significant leap in efficiency and accuracy for semiconductor manufacturing, crucial for the advancement of modern electronics.